Empirical mode decomposition application for short-term flicker severity

dc.authoridGerek, Omer Nezih/0000-0001-8183-1356
dc.contributor.authorOnal, Yasemin
dc.contributor.authorGerek, Omer Nezih
dc.contributor.authorEce, Dogan Gokhan
dc.date.accessioned2025-05-20T18:53:37Z
dc.date.issued2016
dc.departmentBilecik Şeyh Edebali Üniversitesi
dc.description.abstractIn this article, an approach based on empirical mode decomposition (EMD) is suggested in order to calculate short-term flicker severity, Pst, in power systems. EMD is a new signal processing method used for the analysis of nonlinear and nonstationary signals. Pst is an important quantity in the electric power quality index defined by the International Electrotechnical Commission. In the suggested approach, the voltage signal is separated into intrinsic mode function components using EMD. These components are used for calculating the voltage flicker amplitude and frequency, and Pst is calculated as a result of the statistical evaluation of flicker amplitude. EMD is thought to be efficient in finding the flickers and calculating Pst due to power to find the changes in the oscillating signal envelope of EMD. Simulations are made using an input signal modulated with single and multiflicker frequency. Simulations show that the approach is usable in the calculation of Pst and it gives good results.
dc.identifier.doi10.3906/elk-1306-201
dc.identifier.endpage509
dc.identifier.issn1300-0632
dc.identifier.issn1303-6203
dc.identifier.issue2
dc.identifier.scopus2-s2.0-84962538686
dc.identifier.scopusqualityQ2
dc.identifier.startpage499
dc.identifier.trdizinid244650
dc.identifier.urihttps://doi.org/10.3906/elk-1306-201
dc.identifier.urihttps://search.trdizin.gov.tr/tr/yayin/detay/244650
dc.identifier.urihttps://hdl.handle.net/11552/6942
dc.identifier.volume24
dc.identifier.wosWOS:000369325300012
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWoS
dc.indekslendigikaynakScopus
dc.indekslendigikaynakTR-Dizin
dc.indekslendigikaynakWoS - Science Citation Index Expanded
dc.language.isoen
dc.publisherTubitak Scientific & Technological Research Council Turkey
dc.relation.ispartofTurkish Journal of Electrical Engineering and Computer Sciences
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/openAccess
dc.snmzKA_WOS_20250518
dc.subjectShort term flicker severity
dc.subjectempirical mode decomposition
dc.subjectintrinsic mode function
dc.subjectvoltage flicker
dc.subjectpower quality
dc.titleEmpirical mode decomposition application for short-term flicker severity
dc.typeArticle

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