Short-termflickerseverity indexcalculation using Hilbert-Huang Transform
| dc.contributor.author | Önal, Yasemin | |
| dc.contributor.author | Gerek, Ömer Nezih | |
| dc.contributor.author | Ece, Doǧan Gökhan | |
| dc.date.accessioned | 2025-05-20T18:47:28Z | |
| dc.date.issued | 2011 | |
| dc.department | Bilecik Şeyh Edebali Üniversitesi | |
| dc.description | 2011 IEEE 19th Signal Processing and Communications Applications Conference, SIU 2011 -- 20 April 2011 through 22 April 2011 -- Antalya -- 85528 | |
| dc.description.abstract | This article proposes an approach to calculate the short term flicker magnitude (Pst) using Hilbert-Huang Transform (HHT). HHT is an approach which is commonly used in the analysis of nonlinear and nonstationary signals. Since flicker corresponds to a variation of the envelope of a sinusoidal voltage waveform, the utilization of HHT is reasonable. The magnitude of the short term flicker (Pst) is an important power quality parameter that is established by the International Electrotechnical Commission (IEC). In the proposed method, the HHT parameters such as Empirical Mode Decomposition (EMD) and Intrinsic Mode Function (IMF) are evaluated. The short term flicker magnitude (Pst) is claimed to be determined as a nonlinear and statistical function of the waveform magnitude and frequencies obtained by EMD, which is known to succeed in determination of envelope variations. The proposed method is also experimentally observed to precisely determine the (Pst) value. © 2011 IEEE. | |
| dc.identifier.doi | 10.1109/SIU.2011.5929630 | |
| dc.identifier.endpage | 233 | |
| dc.identifier.isbn | 978-145770463-5 | |
| dc.identifier.scopus | 2-s2.0-79960416090 | |
| dc.identifier.scopusquality | N/A | |
| dc.identifier.startpage | 230 | |
| dc.identifier.uri | https://doi.org/10.1109/SIU.2011.5929630 | |
| dc.identifier.uri | https://hdl.handle.net/11552/6414 | |
| dc.indekslendigikaynak | Scopus | |
| dc.language.iso | tr | |
| dc.relation.ispartof | 2011 IEEE 19th Signal Processing and Communications Applications Conference, SIU 2011 | |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.snmz | KA_Scopus_20250518 | |
| dc.subject | Signal processing | |
| dc.subject | Empirical mode decomposition | |
| dc.subject | Hilbert Huang transforms | |
| dc.subject | International Electrotechnical Commission | |
| dc.subject | Intrinsic mode functions | |
| dc.subject | Nonlinear and non-stationary signals | |
| dc.subject | Power quality parameters | |
| dc.subject | Short term | |
| dc.subject | Sinusoidal voltage waveform | |
| dc.subject | Statistical functions | |
| dc.subject | Wave forms | |
| dc.subject | Mathematical transformations | |
| dc.title | Short-termflickerseverity indexcalculation using Hilbert-Huang Transform | |
| dc.title.alternative | Kisa dönem kirpişma şi̇ddeti̇ni̇n Hilbert-Huang dönüşümü i̇le hesaplanmasi | |
| dc.type | Conference Object |












